Scanning electron microscopy uses a beam of electrons to scan across the surface of a sample and image the surface topography at high resolution and with a large depth of focus. Conventionally, the electron beam interacts with the surface of the specimen (which has been coated with an ultrathin layer of metal) to release secondary electrons which are detected to create the image although backscattered (reflected) electrons from the scanning beam can also be detected. The electron beam also generates x-rays from the sample which can be detected and characterised to identify and map the elemental composition of the sample. Most imaging is done using specially dried and coated samples under high vacuum but low vacuum and environmental modes can be used on some uncoated samples.
View a gallery of our scanning electron microscopy images here .
Our ultra high resolution Tescan Clara SEM is equipped with a ConnectomX Katana serial block face imaging system for 3D imaging of samples, and an Oxford Instruments ULTIM Extreme windowless EDX detector, allowing simultaneous serial block face imaging and elemental analysis.
We are in the process of procuring a second SEM/serial block face instrument to replace our FEI quanta 250 / Gatan 30View system which has been written after a burst ceiling pipe in the hospital's cooling system flooded it with glycol.
Find out more about serial block face imaging here .