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The University of Southampton
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Electrical property assessment

The electrical properties can be assess using the Atomic Force microscope using two techniques Electric Force Microscopy (EFM) and Kelvin Force Microscopy (KFM).  EFM and KFM employ a conductive AFM tip that interacts with the sample according to the sample’s electrostatic characteristics.  EFM is an imaging technique that maps the electric field emanating from the sample surface. KFM maps the variation of the contact potential between the tip and the sample.

nCATS Facility – coating assessment equipment includes:


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