Skip to main navigationSkip to main content
The University of Southampton
µ-VIS: Multidisciplinary, Multiscale, Microtomographic Volume Imaging

Nikon/Xtek 160 kVp Benchtop

- Training and hands-on experience-

Nikon/X-Tek 160 kVp Benchtop
Nikon/X-Tek 160 kVp Benchtop

Centre’s first XCT scanner. Bought back in 2009 and now mainly used for training (MSc, PhD students) and demonstration purposes. Is equipped with a 160 kVp X-Ray reflection source (Mo and W target), capable of maintaining a spot size ≥ 3 µm. Its 1248x1248 pixels flat panel detector allows for imaging of samples up to 90 mm diameter.

In a nutshell:

‣ 30 -160 kVp
‣ reflection source, ~3µm spot size limit
‣ 1248x1248 flat panel detector
‣ samples to ~90mm diameter, 5kg

 

We use cookies to ensure that we give you the best experience on our website. If you continue without changing your settings, we will assume that you are happy to receive cookies on the University of Southampton website.

×