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The University of Southampton
µ-VIS: Multidisciplinary, Multiscale, Microtomographic Volume Imaging

Nikon/Xtek 160 kVp Benchtop

- Training and hands-on experience-

Nikon/X-Tek 160 kVp Benchtop
Nikon/X-Tek 160 kVp Benchtop

Centre’s first XCT scanner. Bought back in 2009 and now mainly used for training (MSc, PhD students) and demonstration purposes. Is equipped with a 160 kVp X-Ray reflection source (Mo and W target), capable of maintaining a spot size ≥ 3 µm. Its 1248x1248 pixels flat panel detector allows for imaging of samples up to 90 mm diameter.

In a nutshell:

‣ 30 -160 kVp
‣ reflection source, ~3µm spot size limit
‣ 1248x1248 flat panel detector
‣ samples to ~90mm diameter, 5kg


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