nanoCT via focused X-ray optics - Zeiss presentation Event

Speakers: Drs Benjamin Hornberger & William Harris, Carl Zeiss X-ray Microscopy

X-ray microscopy (XRM) provides non-destructive 3D imaging capabilities on specimens across a range of length scales, observing features with sizes spanning from nanometers to millimeters. Recent developments, inspired by advances at dedicated synchrotron sources, have incorporated a number of X-ray optical elements that have driven resolution and contrast to levels previously unachievable by conventional X-ray computed tomography (CT) instrumentation.