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µ-VIS: Multidisciplinary, Multiscale, Microtomographic Volume Imaging

Modified 225 kVp Nikon/Xtek HMX

 - All-purpose X-Ray CT and Radiographic inspection system -

Modified Nikon/Xtek HMX (225 kVp)
Modified Nikon/Xtek HMX (225 kVp)

This is a custom Nikon XTEK XTH 225 kVp micro-focus CT system equipped with a robotic sample exchanger (~ 150 mm height limit). It is perfect for relatively small specimens (< 300 mm in height) that can be scanned using a 225 kVp X-Ray source. The source can be configured for high resolution or high flux through a range of different anodes; namely a transmission anode (spot ≥ 1 µm, low flux), a standard multi-material reflection anode (spot ≥ 3 µm, 'normal' flux) and a rotating anode (spot  ≥ 10µm, x3 -5 flux). A labyrinth at the rear of the system allows routing of cables and pipes that can control and feed in-situ rigs for time-resolved (4D) µ-CT experiments.


In a nutshell:

‣ three configurations
‣ transmission (~1µm spot limit, low flux)
‣ standard reflection (~3µm spot, 'normal' flux)
‣ rotating target (~10µm spot limit, x3-5 flux)
‣ 2 x 2k flat panel detector
‣ samples to ~300mm and 50kg
‣ robotic sample exchange (~150mm height limit)

Modified Nikon/Xtek HMX (225 kVp)
Modified Nikon/Xtek HMX (225 kVp)

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