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The University of Southampton
µ-VIS: Multidisciplinary, Multiscale, Microtomographic Volume Imaging

Zeiss 160 kVp Versa 510

- Submicron resolution and versatility -

Zeiss 160 kVp Versa 510
Zeiss 160 kVp Versa 510

This scanner uses a two-stage magnification approach to achieve sub-micron spatial resolution at source to object distance much greater than these allowed in conventional XCT systems. Zeiss’s resolution at a distance, RaaDTM, approach combines the geometric magnification of the X-Ray imaging with a smart system of microscope lenses to further magnify the image. The system is fitted with X0.4, X4, X20, and X40 magnification lens mounted on a barrel mount for rapid change over. This means that the operator can achieve submicron resolution (pixel size ≥ 70 nm or spatial resolution ≥ 0.7 µm) at large working distances, allowing for imaging of larger specimens or small specimens in contained in-situ rings. Importantly, the machine is capable of phase-contrast imaging overcoming an imortant limitations of convectional absorption-based CT imaging; i.e. low or complete absence of contrast for low Z materials. The latter is particular useful for biomedical imaging, CFRP and polymer imaging applications.

In a nutshell:

‣ 30 -160 kVp
‣ 2048 x 2048 pixel detector
‣ multiple magnification objectives up to 40x
‣ 0.7 µm true spatial resolution
‣ phase-contrast imaging modes

 

Zeiss 160 kVp Versa 510
Zeiss 160 kVp Versa 510
Zeiss 160 kVp Versa 510
Zeiss 160 kVp Versa 510
Zeiss 160 kVp Versa 510
Zeiss 160 kVp Versa 510
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