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Research project

Deep UV high-value manufacturing laser instruments

Staff

Lead researcher

Dr Jacob Mackenzie

Associate Professor

Research interests

  • Waveguide amplifiers and lasers
  • Cryogenically cooled lasers for peak and average power scaling
  • Ultra-fast high repetition rate compact lasers
Other researchers

Professor Andy Clarkson

Professor of Optoelectronics Research

Professor Yifeng Yang

Prof. of Cryogenics & Superconductivity

Research interests

  • Superconducting devices and machines
  • Enabling sciences of applied superconductivity
  • Material properties at low temperature for applications

Collaborating research institutes, centres and groups

Energy Technology Group

The Energy Technology Group researches is the focal point for energy research in Engineering and the Environment. Our aim is to address major scientific and technological challenges faced in energy efficiency and technology.

Research outputs

Temperature-dependent analytical thermal model for end-pumped solid-state lasers
Luigi Cini,
Wendell O.S. Bailey,
Yifeng Yang,
& Jacob I. Mackenzie
, 2017
Type: conference
Temperature-dependent spectroscopy and microchip laser operation of Nd:KGd(WO4)2
P. Loiko,
S. Yoon,
J.M. Serres,
X. Mateos,
S. Beecher,
R.B. Birch,
V.G. Savitski,
A.J. Kemp,
K. Yumashev,
U. Griebner,
V. Petrov,
M. Aguiló,
F. Díaz,
& J. Mackenzie
, 2016 , Optical Materials , 58 , 365--372
DOI: 10.1016/j.optmat.2016.06.005
Type: article
Concentration dependence of energy transfer upconversion in Nd:YAG
S.J. Yoon,
R.P. Yan,
S.J. Beecher,
& J.I. Mackenzie
, 2015 , Optical Materials Express , 5 (5) , 926--931
DOI: 10.1364/OME.5.000926
Type: article
Energy transfer upconversion measurements for popular neodymium-doped crystals
S.J. Yoon,
R.P. Yan,
S.J. Beecher,
& J.I. Mackenzie
, 2015
DOI: 10.1117/12.2082707
Type: conference
Measuring the elevated temperature dependence of up-conversion in Nd:YAG
RenPeng Yan,
Sung Jin Yoon,
Stephen J. Beecher,
& Jacob I. Mackenzie
, 2015 , IEEE Journal of Selected Topics in Quantum Electronics , 21 (1)
DOI: 10.1109/JSTQE.2014.2336776
Type: article