Research project

Resilient and Testble Energy-Efficient Digital Hardware

Lead researchers:

Professor Sir Bashir Al-Hashimi
Research funder:

EPSRC
Status:

Not active

Staff

Lead researchers

Professor Sir Bashir Al-Hashimi CBE, FREng, FIEEE, FIET, FBCS

Research interests

Energy-efficient mobile computing systems
Low-power test and test-data compression of digital integrated circuits and energy-harvesting…
Wearable and Autonomous Computing for Future Smart Cities

Connect with Bashir

Email: bmah@ecs.soton.ac.uk

Research outputs

Collective-aware system-on-chips for dependable IoT applications

Vasileios Tenentes, Daniele Rossi & Bashir M. Al-Hashimi, 2018

DOI: 10.1109/IOLTS.2018.8474172

Type: conference

Exploiting aging benefits for the design of reliable drowsy cache memories

Daniele Rossi, Vasileios Tenentes, Sudhakar Reddy, Bashir Al-Hashimi & Andrew Brown, 2018, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 37(7), 1345-1357

DOI: 10.1109/TCAD.2017.2729399

Type: article

Leakage current analysis for diagnosis of bridge defects in power-gating designs

Vasileios Tenentes, Daniele Rossi, Saqib Khursheed, Bashir Al-Hashimi & Krishnendu Chakrabarty, 2018, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 37(4), 883-895

DOI: 10.1109/TCAD.2017.2729462

Type: article

Hardware and software innovations in energy-efficient system-reliability monitoring

Vasileios Tenentes, Charles Leech, Graeme Bragg, Geoffrey Merrett, Bashir Al-Hashimi, Hussam Amrouch, Jörg Henkel & Shidhartha Das, 2017

DOI: 10.1109/DFT.2017.8244435

Type: conference

Susceptible workload evaluation and protection using selective fault tolerance

Mauricio, Daniel Gutierrez Alcala, Vasileios Tenentes, Daniele Rossi & Tomasz Kazmierski, 2017, Journal of Electronic Testing, 33(4), 463–477

DOI: 10.1007/s10836-017-5668-7

Type: article

Coarse-grained online monitoring of BTI aging by reusing power gating infrastructure

Vasileios Tenentes, Daniele Rossi, Sheng Yang, Saqib Khursheed, Bashir M. Al-Hashimi & Steve R. Gunn, 2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 25(4), 1397-1407

DOI: 10.1109/TVLSI.2016.2626218

Type: article

Aging benefits in nanometer CMOS designs

Daniele Rossi, Vasileios Tenentes, Sheng Yang, Saqib Khursheed & Bashir Al-Hashimi, 2017, IEEE Transactions on Circuits and Systems II: Express Briefs, 64(3), 324-328

DOI: 10.1109/TCSII.2016.2561206

Type: article