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Research project

Compact imaging system for semiconductor inspection based on metalenses

Staff

Lead researchers

Dr Bruce (Jun-Yu) Ou

Associate Professor
Research interests
  • Metalens for imaging and metrology
  • AI for nanoimaging
  • Nano-optomechanics
Connect with Bruce (Jun-Yu)

Email: Bruce.Ou@soton.ac.uk

Research outputs

Tunable on-chip optical traps for levitating particles based on single-layer metasurface
Chuang Sun, Hailong Pi, Kian Shen Kiang, Tiberius S. Georgescu, Jun-Yu Ou, Hendrik Ulbricht & Jize Yan, 2024, Nanophotonics
DOI: 10.1515/nanoph-2023-0873
Type: article