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Courses / Modules / CHEM6153 X-Ray Diffraction as a Characterisation Method

X-Ray Diffraction as a Characterisation Method

When you'll study it
Semester 1
CATS points
15
ECTS points
7.5
Level
Level 7
Module lead
Mark Light

Module overview

Students will become familiar with the types of information that x-ray diffraction can provide on the structure of a wide variety of samples. They will gain an understanding of the underlying principles and learn how to apply these to conduct the most appropriate measurements. They will learn to interpret real data and extract structural information. Through the coursework, they will gain a greater insight into their own characterisation problems. Extensive experience of the software packages Olex2, PDXL, GSAS & Rex.Cell will be gained.

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