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The University of Southampton
Advanced Composite Materials Facility

Atomic Force Microscopy

Atomic Force Microscopy (AFM) can be used to obtain detailed, high throughput surface images down to the sub-micron level. Our AFM system is an Agilent 5600LS Scanning Probe Microscope (SPM) with a fully programmable motorised stage for fast, accurate probe positioning. This can be used for imaging and mapping large specimens at atomic scale resolution. 

AFM images of thin films
Thin film surface images obtained by AFM

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