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Doctor Basel Halak

Doctor Basel Halak

 MSc, PhD, SFHEA, NTF
Associate Professor

Accepting applications from PhD students.

Connect with Basel

Email: basel.halak@soton.ac.uk

Tel: +44 23 8059 7381

Address: B59, West Highfield Campus, University Road, SO17 1BJ (View in Google Maps)

Research

Research groups

Member of:

Current research

Hardware Security

The Internet of Things (IoT) consists of numerous inter-connected resource-constrained devices such as sensors nodes and actuators, which are linked to the Internet. By 2020 it is anticipated that the IoT paradigm will include approximately 20 billion connected devices. The interconnection of such devices provides the ability to collect a huge amount of data for processing and analysis. A significant portion of the transacted data between IoT devices is private information, which must not in any way be eavesdropped on or tampered with. Such devices typically have limited area and energy resources, which makes the use of classic cryptography prohibitively expensive. Physically Unclonable Functions (PUFs) are a class of novel hardware security primitives that promise a paradigm shift in many security applications; their relatively simple architecture can answer many of the security challenges of energy-constrained IoT devices. I am working on developing hardware-based security solutions for resource-constrained IoT devices using physically Unclonable functions and hardware monitoring schemes.

Reliability and Fault Tolerance Techniques 

Aggressive technology scaling has aggravated a number of reliability problems, particularly the aging of CMOS devices. This is caused by several mechanisms, namely: Bias Temperature Instability (BTI) is usually considered as the primary reliability concern in modern technologies, it is characterized by a positive shift in the absolute value of the threshold voltage of MOS devices, which leads to an increase in the propagation delay of various components in System-on-Chips over time. If this performance degradation exceeds circuit time margins, it may lead to system failure, thus reducing its long-term reliability. Other reliability problems include crosstalk noise and radiation. I am working on developing a range of solutions enhance the resiliency of CMOS circuits against these various reliability problems. To reduce the impact of ageing; I am looking into the use of ageing prediction sensors, circuit-level mitigating techniques and ageing aware synthesis. My work also includes developing radiation hardened designs and enhancing the reliability of on chip communications 

Research projects

Completed projects

Researchers:
Doctor Basel Halak
Sponsor: Royal Academy of Engineering
Researchers:
Doctor Basel Halak
Sponsor: Royal Academy of Engineering
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