About the Chemical nanoanalysis scanning electron microscope
The Chemical Nanoanalysis Scanning Electron Microscope (CNSEM) facility offers a high resolution field emission SEM, in combination with dual-EDS and correlative Raman spectrometer.
The first EDS detector is suitable for elemental composition analysis, typically between 5 – 30 kV at high throughput mapping.
The second EDS is windowless with element detection down to Li Ka (56 eV) and intended for low energy work <5 keV for superior surface sensitivity.
For the Raman analysis the sample is translated over to a 100x objective lens within the chamber, where the laser spot size is ~360nm, offering sub-micron mapping capability. Raman offers complimentary chemical information to EDS, allowing you to fingerprint polymers, and ordered and disordered structures.
- imaging resolution down 1 nm - InLensDuo for improved surface sensitive imaging
- Oxford Instruments Ultim 170 EDS
- Oxford Instruments Extreme 100 EDS
- WITec Raman RISE
- sample shuttle for air-sensitive sample mounting inside a glovebox
- plasma cleaner