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The University of Southampton
Advanced Composite Materials Facility

Scanning Electron Microscope with Energy Dispersive X-Ray attachment

Our Scanning Electron Microscope is a JSM59 SEM manufactured by JEOL with the INCA software package form Oxford Instruments to control the Energy Dispersive X-Ray (EDX) analysis.

 

 

JSM59 Scanning Electron Microscope
JSM59 Scanning Electron Microscope

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